Optics: measuring and testing – By light interference – For refractive indexing
Reexamination Certificate
2006-05-16
2006-05-16
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
For refractive indexing
Reexamination Certificate
active
07046373
ABSTRACT:
Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials with a single measurement operation. The system employs an interferometer as a “shear interferometer” with the advantage of varying the wavelength of the luminous source. The index of refraction and the thickness are determined in two phases. Firstly it is determined the optical path analyzing the displacement of interferometric signal obtained by orthogonal incidence; successively, by means of phase recovery techniques and the previously determined optical path value, it is possible to obtain the index of refraction of the material. From the knowledge of the index and of the optical path it is obtained the material thickness.
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patent: 5355218 (1994-10-01), Matsuda et al.
patent: 6496268 (2002-12-01), McKie et al.
Coppola Giuseppe
De Nicola Sergio
Ferraro Pietro
Iodice Mario
Consiglio Nazionale Delle Ricerche
Egbert Law Offices
Lyons Michael A.
Toatley , Jr. Gregory J.
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