Interferometric system for the detection and location of reflect

Details Interferometric system for the detection and location of reflect Interferometric system for the detection and location of reflect

1995-02-24

1997-03-25

Gonzalez, Frank

Optics: measuring and testing

By particle light scattering

With photocell detection

356 731, G01B 902

Patent

active

056150113

ABSTRACT:
Interferometric system for the detection and location of reflector faults of light-guiding structures.
This system has a first interferometer comprising an incoherent light source (4), an optical coupler (6) connected to the source and to the structure (2), means (18a, 18b) for the displacement of a support (16) in translation at constant speed, a reflector (24) fixed to the support, photodetection means (26) supplying during a translation of the support an interferogram for a reflector fault of the structure, pulse generating means (28 to 48) and means (50) which sample the interferogram by pulses, which store the samples obtained and locate the reflector faults.

REFERENCES:
patent: 5247342 (1993-09-01), Tamura et al.
patent: 5270790 (1993-12-01), Matsumura
patent: 5365335 (1994-11-01), Sorin
Journal of the Optical Society of America, vol. 7, No. 5, May 1990, NY, USA, pp. 857-867, K. Takada et al., "Interferometric Optical-Time-Domain Reflectometer To Determine Backscattering Characterization of Silica-Based Glass Waveguides".
Hewlett-Packard Journal, vol. 44, No. 1, Feb. 1993, Palo Alto, CA, pp. 39-48, H. Booster et al., "Design of a Precision Optical Low-Coherence Reflectometer".
SPIE Conference, Orlando, Florida, Apr. 1-5, 1991, 1474-1440, Masaru Kobayashi et al, "High-Spatial-Resolution and High-Sensitivity Interferometric Optical-Time-Domain Reflectometer".
Electronics Letters, vol. 21, No. 18, Aug. 1985, Enage GB, pp. 781-783, M. Tsubokawa et al., "Chromatic Deispersion Measurement of a SM Fibre by Optical Heterodyne Interferometry".

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