Interferometric piezoelectric change of state monitor

Details Interferometric piezoelectric change of state monitor Interferometric piezoelectric change of state monitor

1982-10-25

1986-02-25

Willis, Davis L.

Optics: measuring and testing

By polarized light examination

With birefringent element

250227, G01B 902

Patent

active

045726701

ABSTRACT:
An improved interferometric apparatus is disclosed which enables the accurate measurement of variations in surface displacement. The interferometric apparatus is coupled to a vibrating piezoelectric crystal which may be oriented to detect a parameter that causes movement of the crystal. By comparing a reference signal generated by the interferometer in the absence of any parameter affecting the piezoelectric crystal, the magnitude of any parameter thereafter affecting the piezoelectric crystal can be easily and accurately determined by the interferometer output. The combination may therefore be used to provide inexpensive and low power laser gyroscopes and similar structures which may be employed to sense rate, acceleration and other parameters in electronic systems.

REFERENCES:
patent: 3073168 (1963-01-01), Adams et al.
patent: 3224323 (1965-12-01), Chitayat
patent: 4380394 (1983-04-01), Stowe
patent: 4444053 (1984-04-01), Rider
Kwaaitaal, "Contribution to the Interferometric Measurement of Sub-Angstrom Vibrations," Rev. Sci. Instru., vol. 45, No. 1, pp. 39-41, Jan. 1974.

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