Interferometric optical tomography

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S497000

Reexamination Certificate

active

07352474

ABSTRACT:
Embodiments of the present disclosure provide systems and methods for constructing a profile of sample object. Briefly described, in architecture, one embodiment of the system, among others, can be implemented as follows. An interferometer device is used to collect interference images of a sample object at a sequence of angles around the sample object. Accordingly, a controller device rotates the sample object to enable acquisition of the interference images; and a projection generator produces projections of the sample object from the interference images at the sequence of angles. Further, a tomographic device constructs the profile of the optical device from the projections of the interference images. The profile is capable of characterizing small index variations of less than 1×10−4. Other systems and methods are also included.

REFERENCES:
patent: 5798840 (1998-08-01), Beiting
Gorski and Kujawinska. “Three-dimensional reconstruction of refractive index inhomogeneities in optcial phase elements” Optics and Lasers in Engineering 38 (2002) pp. 373-385.
Brent L. Bachim and Thomas K. Gaylord; “Micro-Interferometric Optical Phase Tomography for Measuring Small, Asymmetric Refractive Index Differences in the Profiles of Optical Fibers and Fiber Devices;” Applied Optics, vol. 44, Issue 3, Jan. 2005; pp. 316-327.
W.J. Stewart; “Optical Fiber and Preform Profiling Technology;” IEEE Journal of Quantum Electronics, vol. QE-18, No. 10, Oct. 1982; pp. 1451-1466.
Maksymilian Pluta; “Profile Refractometry of Optical Fibers by Using Double-Refracting Microinterferometry;” Gradient-Index Optics in Science and Engineering, 1996; pp. 113-127.
K.W. Raine, J.G.N. Baines, and D.E. Putland; “Refractive Index Profiling-State of the Art;” Journal of Lightwave Technology, vol. 7, No. 8, Aug. 1989; pp. 1162-1169.
Yasuo Kokubun and Kenichi Iga; “Precise Measurement of the Refractive Index Profile of Optical Fibers by a Nondestructive Interference Method;” The Transactions of the IECE of Japan, vol. E60, No. 12, Dec. 1977; pp. 702-707.
D. Marcuse and H.M. Presby; “Focusing Method for Nondestructive Measurement of Optical Fiber Index Profiles;” Applied Optics, vol. 18, No. 1, Jan. 1979; pp. 14-22.
Takanori Okoshi and Masayuki Nishimura; “Measurement of Axially Nonsymmetrical Refractive-Index Distribution of a Single-Mode Fiber by a Multidirectional Scattering-Pattern Method;” Journal of Lightwave Technology, vol. LT-1, No. 1, Mar. 1983; pp. 9-14.
J. Stone and H.E. Earl; “Optical Fiber Refractometry by Interference Microscopy: A Simplified Method;” Applied Optics, vol. 17, No. 22, Nov. 1978; pp. 3647-3652.
Kenji Toga, Nobuo Amano, and Ken-Ichi Noda; “Microscopic Computer Tomography Measurement of Nonaxisymmetrically Distributed Optical Fiber Refractive Index;” Journal of Lightwave Technology, vol. 6, No. 1, Jan. 1988; pp. 73-79.
Dale Alicia Viskoe and Gregory W. Donohoe; “Optimal Computed Tomography Data Acquisition Techniques and Filter Selection for Detection of Small Density Variations;” IEEE Transactions on Instrumentation and Measurement, vol. 45, No. 1, Feb. 1996; pp. 70-76.
Qian Zhong and Daryl Inniss; “Characterization of the Lightguiding Structure of Optical Fibers by Atomic Force Microscopy;” Journal of Lightwave Technology, vol. 12, No. 9, Sep. 1994; pp. 1517-1523.
H.M. Presby, D. Marcuse, H.W. Astle, and L.M. Boggs; “Rapid Automatic Index Profiling of Whole-Fiber Samples: Part II;” The Bell System Technical Journal, Apr. 1979; pp. 883-903.
Malgozata Sochacka; “Optical Fibers Profiling by Phase-Stepping Transverse Interferometry;” Journal of Lightwave Technology, vol. 12, No. 1, Jan. 1994; pp. 19-23.
Shane T. Huntington, Ann Roberts, Keith A. Nugent, and Simon C. Fleming; “Complete Characterization of a High-Numerical-Aperature Small-Core Fiber with Subwavelength Resolution Using Atomic Force Microscopy and Near-Field Scanning Optical Microscopy;” Society of Photo-Optical Instrumentation Engineers, 2003; pp. 1893-1895.
S.T. Huntington, P. Mulvaney, A. Roberts, K.A. Nugent, and M. Bazylenko; “Atomic Force Microscopy for the Determination of Refractive Index Profiles of Optical Fibers and Waveguides: A Quantitative Study;” J. Appl. Phys., Sep. 1997; pp. 2730-2734.
Witold Górski; “The Influence of Diffraction in Microinterferometry and Microtomography of Optical Fibers;” Opt. Lasers Engineering, 2004; pp. 563-583.
Witold Górski and Malgorzata Kujawińska; “Three-Dimensional Reconstruction of Refractive Index Inhomogeneities in Optical Phase Elements;” Opt. Lasers Engineering, 2002; pp. 373-385.
Norman H. Fontaine and Matt Young; “Two-Dimensional Index Profiling of Fibers and Waveguides;” Applied Optics, vol. 38, No. 33; pp. 6836-6844.
Kokou Dossou, Sophie LaRochelle, and Marie Fontain; “Numerical Analysis of the Contribution of the Transverse Asymmetry in the Photo-Induced Index Change Profile to the Birefringence of Optical Fiber;” Journal of Lightwave Technology, vol. 20, No. 8, Aug. 2002; pp. 1463-1470.
L.M. Boggs, H.M. Presby, and D. Marcuse; “Rapid Automatic Index Profiling of Whole-Fiber Sample: Part I;” The Bell System Technical Journal, vol. 58, No. 4, Apr. 1979; pp. 867-883.
A. Barty, K.A. Nugent, A. Roberts, and D. Paganin; “Quantitative Phase Tomography;” Opt. Lasers Engineering, Mar. 2000; pp. 329-336.
N. Barakat, H.A. El-Hennawi, E.Abd. El-Ghafar, H. El-Ghandoor, R. Hassan, F. El-Diasty; “Three-Dimensional Refractive Index Profile of a GRIN Optical Waveguide Using Multiple Beam Interference Fringes;” Opt. Lasers Engineering, May 2001; pp. 39-47.
E. Anemogiannis, E.N. Glytsis, and T.K. Gaylord; “Transmission Characteristics of Long-Period Fiber Gratings Having Arbitrary Azimuthal/Radial Refractive Index Variations;” Journal of Lightwave Technology, vol. 21, No. 1, Jan. 2003; pp. 218-227.
Zhongyao Liu, Xiaoman Dong, Qianghua Chen, Chunyong Yin, Yuxian Xu, and Yingjun Zheng; “Nondestructive Measurement of an Optical Fiber Refractive-Index Profile by a Transmitted-Light Differential Interference Contact Microscope;” Applied Optics, vol. 43, No. 7, Mar. 2004; pp. 1485-1492.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Interferometric optical tomography does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Interferometric optical tomography, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometric optical tomography will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2755744

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.