Interferometric optical analyzer and method for measuring...

Optics: measuring and testing – For optical fiber or waveguide inspection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S477000, C356S491000

Reexamination Certificate

active

07426021

ABSTRACT:
An interferometric optical analyzer apparatus comprises a light source, an interferometer and a detection system for determining the linear response, and subsequently any optical parameter, of one or more optical elements using substantially unpolarized light. In one embodiment, the light source supplies substantially unpolarized coherent light over a predetermined range of optical frequencies. The optical element is coupled in one arm of the interferometer and the other arm of the interferometer is used as a reference. The unpolarized light is first passed through the interferometer then through a three-way polarization splitter unit to split the light into at least three light beams according to preselected polarization axes corresponding to three linearly independent states of polarization. The three light beams are coupled to individual detectors and a controller computes Jones matrix elements from the resulting electrical signals. The total polarization independent power may also be determined by an additional detector.

REFERENCES:
patent: 4653917 (1987-03-01), Moeller et al.
patent: 6376830 (2002-04-01), Froggatt et al.
patent: 6542247 (2003-04-01), Bockman
patent: 6606158 (2003-08-01), Rosenfeldt et al.
patent: 6697150 (2004-02-01), Galtarossa et al.
patent: 6788419 (2004-09-01), Cierullies et al.
patent: 6813028 (2004-11-01), Vanwiggeren
patent: 6856398 (2005-02-01), Ruchet
patent: 7088878 (2006-08-01), Waagaard et al.
patent: 2003/0002041 (2003-01-01), Peupelmann et al.
patent: 2003/0095264 (2003-05-01), Ruchet
patent: 2003/0151736 (2003-08-01), Achtenhagen et al.
patent: 2003/0223073 (2003-12-01), VanWiggeren et al.
patent: 2004/0036889 (2004-02-01), Witzel et al.
Optical Vector Analysis Integrates Component Testing, Brian J. Soller Lightwave, Mar. 2004.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Interferometric optical analyzer and method for measuring... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Interferometric optical analyzer and method for measuring..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometric optical analyzer and method for measuring... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3988334

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.