Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2006-02-28
2006-02-28
Lee, Hwa Andrew (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
C356S450000
Reexamination Certificate
active
07006230
ABSTRACT:
A method and apparatus for the characterization of an optical pulse includes splitting an optical pulse into two replicas separated by a delay, modulating at least one of the two replicas with a linear temporal phase modulation, measuring a spectrum of the modulated replicas, and characterizing the optical pulse using the measured spectra. In one embodiment of the present invention a spectral phase difference between the replicas is obtained from the measured spectrum using Fourier Transform Spectral Interferometry.
REFERENCES:
patent: 6728436 (2004-04-01), Liu et al.
patent: 2004/0218930 (2004-11-01), Dorrer et al.
Lepetit, Cheriaux, and Joffre. “Linear techniques of phase measurement by femtosecond spectral interferometry for applications in spectroscopy” Dec. 1995. Journal of the Optical Society of America B 12, 2467-2474.
Dorrer and Kang. “Highly sensitive direct characterization of femtosecond pulses by electro-optic spectral shearing interferometry” Mar. 15, 2003. Optics Letters 28, 477-479.
Walmsey and Wong. “Analysis of ultrashort pulse-shpae measurement using linear interferometers” Feb. 15, 1994. Optics Letters 19, 287-289.
SPIDER References. Universtiy of Oxford Website. http://ultrafast.physics.ox.ac.uk/spider/refs.html.
“Analysis of Ultrashort Pulse-Shape Measurement Using Linear Interferometers”, V. Wong and I. A. Walmsley, Optics Letters, vol. 19, No. 4, Feb. 15, 1994, p. 287-289.
Dorrer Christophe J.
Kang Inuk
Connolly Patrick
Lee Hwa (Andrew)
Lucent Technologies - Inc.
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