Interferometric measuring device

Details Interferometric measuring device Interferometric measuring device

2006-11-21

2006-11-21

Lee, Hwa (Andrew) (Department: 2877)

Optics: measuring and testing

By light interference

For dimensional measurement

C356S479000

Reexamination Certificate

active

07139079

ABSTRACT:
An interferometric measuring device for measuring a surface or an interface of an object to be measured is provided. The effect of vibration on the measurement result is suppressed by providing a connecting unit by which at least one section of the measuring device assigned to the object to be measured is mechanically rigidly and detachably connectable directly to the object to be measured.

REFERENCES:
patent: 4234254 (1980-11-01), Dreisbach et al.
patent: 4541717 (1985-09-01), Itamato et al.
patent: 4596466 (1986-06-01), Ulrich
patent: 5689337 (1997-11-01), Lamb et al.
patent: 6661522 (2003-12-01), Ouchi
patent: 6813029 (2004-11-01), Lindner et al.
patent: 41 08 944 (1992-09-01), None
patent: 197 21 842 (1998-12-01), None
patent: 197 21 843 (1998-12-01), None
De Groot, P., et al., “Surface Profiling by Analysis of White-Light Interferograms in the Spatial Frequency Domain,” J. Mod. Opt., vol. 42, No. 2, 389-401, 1995.
Maak, T., et al., “Endoskopisches 3D-Formmesssysten [Endocospic 3D Mold Measuring System],” Jahrbuch Für Optik und Feinmechanik [Yearbook for Optics and Precision], W.D. Prenzel, ed., Verlag Schiele & Schoen, Berlin 231-240, 1998.

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