Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2005-11-22
2005-11-22
Smith, Zandra V. (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S512000, C356S241100
Reexamination Certificate
active
06967723
ABSTRACT:
An interferometric measuring device includes a reference arm having a reference surface and a measuring arm having lighting optics for deflecting measuring light onto a measuring surface of an object to be measured, and having an image recorder connected to an analyzing device. A rapid, simple measurement with a rugged design of the measuring device may be achieved by configuring the lighting optics as a light guide body insertable into a cavity in the object to be measured, having a peripheral, radially symmetrical effective reflex surface directed radially or obliquely outward, and also including at least one deflector surface deflecting the measuring light onto same.
REFERENCES:
patent: 4898470 (1990-02-01), Cleaveland
patent: 5004339 (1991-04-01), Pryor et al.
patent: 5933231 (1999-08-01), Bieman et al.
patent: 6154279 (2000-11-01), Thayer
patent: 6714307 (2004-03-01), De Groot et al.
patent: 6822746 (2004-11-01), Prinzhausen et al.
patent: 2003/0048532 (2003-03-01), Lidner et al.
patent: 100 39 239 (2002-03-01), None
patent: 101 31 778 (2003-01-01), None
Berger Martin
Bohn Gunther
Straehle Jochen
Connolly Patrick
Kenyon & Kenyon
Robert & Bosch GmbH
Smith Zandra V.
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