Interferometric measuring apparatus for making absolute measurem

Details Interferometric measuring apparatus for making absolute measurem Interferometric measuring apparatus for making absolute measurem

1994-09-30

1996-07-30

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, 356361, G01B 902

Patent

active

055417302

ABSTRACT:
An absolute interferometer has part of the beam paths making up its measuring and reference arms formed in a waveguide, and part formed in air. The part formed in the waveguide are common mode so that the path length difference is formed in air, thus minimizing inaccuracies in the measurements caused by temperature changes in the waveguide. Phase modulators in the waveguide enable interpolation of the fringe counts to be made to high resolution. The absolute interferometer may be combined with a tracking interferometer, and with air refractometers, all of which have parts of their measuring and reference arms in the waveguide in common mode and symmetrical with each other.

REFERENCES:
patent: 3970389 (1976-07-01), Mendrin et al.
patent: 4865453 (1989-09-01), Gidon et al.
patent: 4941744 (1990-07-01), Yokokura et al.
patent: 4984898 (1991-01-01), Hofler et al.
patent: 5073024 (1991-12-01), Valette et al.
patent: 5396328 (1995-03-01), Jestel et al.
patent: 5459571 (1995-10-01), Dammann et al.

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