Interferometric measurement method and apparatus

Details Interferometric measurement method and apparatus Interferometric measurement method and apparatus

1988-12-19

1990-04-03

LaRoche, Eugene R.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356360, G01B 902

Patent

active

049135503

ABSTRACT:
An electronic speckle pattern interferometric for measuring the movement of a vibrating body (2) uses a coherent light source (16) to illuminate the body. A television camera (4) receives radiation scattered by the body and from a reference beam (7) to form a speckle pattern. Successive measurements are stored in a frame store (8, 9) and displayed on a monitor (10).

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patent: 4191476 (1980-03-01), Pollard
patent: 4352565 (1982-10-01), Rowe et al.
patent: 4637724 (1987-01-01), Howell et al.
patent: 4647154 (1987-03-01), Birnbach et al.
patent: 4652131 (1987-03-01), Fercher et al.
Lokberg, "Use of Chopped Laser Light in Electronic Speckle Pattern Interferometry", Applied Optics, vol. 18, No. 14, Jul. 15, 1979, pp. 2377-2384.
Hurden, "An Instrument for Vibration Mode Analysis Using Elec. Speckle Pat. Interferometry", NDT International, Jun. 1982, vol. 15, No. 3, pp. 143-148.
Lokberg, "Mapping of M-Plane Vibration Modes by Electronic Speckle Pattern Interferometry", Optical Engineering, vol. 24, No. 2, Mar./Apr. 1985, pp. 356-359.
"Real-Time Holography Shows up the Flaws and Stresses", Sensor Review, Jul. 1981, vol. 1, No. 3, pp. 116-117.

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