Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1995-05-18
1996-07-30
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356363, 356138, 2191218, 359197, G01B 902
Patent
active
055417310
ABSTRACT:
A desired design for electronic structures is converted into a graphic design format and sorted into a pseudo-raster format corresponding to scan lines. A laser or other machining beam is controlled by a separate tracking beam utilizing a mid-objective scanning system. The firing frequency of the machining beam is determined by the position of the tracking beam on a detector, as compared to the scan line data. Accuracy is verified by detection of plume or spectra generated during machining. Evaluation and alignment of the machining and tracking beams is by interferometric methods. The system improves optical performance parameters of telecentricity, angle of scanned beam line, location of line in which the scanned line resides, astigmatism and field curvature.
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Balz James G.
Cobb Joshua M.
Freedenberg Candace J.
LaPlante Mark J.
Long David C.
Ahsan Aziz M.
International Business Machines - Corporation
Peterson Peter W.
Turner Samuel A.
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