Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1985-01-15
1987-03-17
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
354 62, 351211, A61B 314, A61B 310
Patent
active
046503021
ABSTRACT:
For purposes of eye examination, a method is provided for determining the presence or absence of structural anomaly in the retina. In this method, the surface of the retina (under zero stress or any one of a selected variety of stress conditions to produce deformation) is illuminated with coherent light and separate exposures or interferograms are made using the reflected light and recorded either photographically or electronically such as by storage or display via the cathode of a television image tube. The exposure may either be holographic, in which case the interferogram is produced by using a reference beam of light derived from the same source that illuminates the object surface, or shearographic, in which case two focused images of the retinal surface section are formed on a photosensitive medium, displaced with respect to one another and overlapping one another. The resultant hologram or shearogram is processed in conventional manner to derive an image of the object surface containing fringes arrayed as a function of the deformation of the surface between the several exposures. These fringes are analyzed to detect anomalous fringe families related to deformation that signifies structural anomaly in the retina.
REFERENCES:
patent: 4402601 (1983-09-01), Riva
LandOfFree
Interferometric eye test method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Interferometric eye test method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometric eye test method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1785017