Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1983-07-27
1985-12-17
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, 356352, G01B 902
Patent
active
045589500
ABSTRACT:
For interferometric measurement of the length of the linear component of movement of a moving point relative to a fixed point and simultaneous recognition of the direction of that movement, two merged or overlapping Fabry-Perot part interferometers are used to form an asymmetric pattern of the reflection or transmission intensity which is periodically dependent on the linear component of the path, the pattern having main and secondary maxima of different heights and main and secondary minima of different depths. The intensity variation is converted by a detector into electrical intensity signals which cross threshold values of trigger circuits to produce output pulses. The pulses are combined and counted to produce displays of the direction and to provide a reading of the instantaneous position of the movable point.
REFERENCES:
patent: 3282148 (1966-11-01), Yamada
patent: 3373651 (1968-03-01), Mack et al.
patent: 4153370 (1979-05-01), Corey, III
patent: 4444501 (1984-04-01), Schwiesow
W. R. C. Rowley, Interferometric Measurement of Length and Distance, Nov. 1972, pp. 887-896, Alta Frequenza, vol. XLI, No. 11.
Jansen Klaus
Ulrich Reinhard
H. Maihak AG
Koren Matthew W.
Willis Davis L.
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