Interferometers

Details Interferometers Interferometers

1973-12-26

1976-08-24

Corbin, John K.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

356113, G01B 902

Patent

active

039763790

ABSTRACT:
Interferometers for precise determination of lengths and more particularly, a highly sensitive interferometer which can produce interference fringes one fringe separation of which corresponds to .lambda./2N (.lambda. is a wavelength of an incident light and N is an integer which is 2, 3, 4 . . . ). The interferometer comprises light emitting means at least one beam splitting means, retroreflecting optical means and bilateral reflecting optical means. Two embodiments of the beam splitting means are provided. The corresponding prisms in both preferred embodiments have the same effect of dividing an incident light into a reference light beam and a measuring light beam, but the configuration and construction of the equivalent prisms of the two embodiments differ slightly in order to provide mutually perpendicular light paths for the divided light beams. Rotator means are provided between the beam splitting means and the bilateral reflecting optical means in one embodiment, between the beam splitting means and the retroreflecting optical means in another embodiment, and between the beam splitting means on the one hand and the bilateral reflecting optical means and retroreflecting optical means on the other hand in a further embodiment. The light paths traversing the bilateral reflecting optical means are common to those traversing the reference and measuring retroreflecting optical means.

REFERENCES:
patent: 3529894 (1970-09-01), Hock
patent: 3601490 (1971-08-01), Erickson
patent: 3822942 (1974-07-01), Hock
Bennett, "A Double-Passed Michelson Interferometer," Optics Communications, vol. 4, No. 6, pp. 428-430, Feb./Mar., 1972.
Francon et al., Polarization Interferometers, Wiley-Interscience, London, pp. 3-5, 1971.

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