Interferometer with thin absorbing beam equalizing pellicle

Details Interferometer with thin absorbing beam equalizing pellicle Interferometer with thin absorbing beam equalizing pellicle

1988-12-09

1990-09-11

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

350314, G01B 902, G01B 522

Patent

active

049557190

ABSTRACT:
An interferometer includes a thin, absorbing pellicle in the path of a test beam to attenuate the test beam so that its intensity is approximately equal to the intensity of a reference beam. The pellicle reflects less than about six percent of the test beam, thereby avoiding spurious reflections that produce spurious fringes.

REFERENCES:
patent: 3998553 (1976-12-01), Hunter et al.
patent: 4820049 (1989-04-01), Biegen
Electro-Optical Systems Design, Aug. 1970, "Solving Design Problems with Pellicles", by Schwartz, Milton J., pp. 870-877.
Melles Griot, "Pellicle Beamsplitters", pp. 13-10 to 13-11.
Applied Optics, vol. 12, No. 9, Sep. 1973, "Wavelength Dependent Transmission of a Pellicle Beam Splitter Used in a Ratio Reflectometer" by T. Saito and M. Wetzel, pp. 2020-2021.
Applied Optics, Mar. 1971, vol. 10, No. 3, "Pellicle for 10.6.mu.", pp. 663-665, by A. Layton, D. Contini, and T. Bayston.
Applied Optics, Jan. 1970, vol. 9, No. 1, "Absolute Specular Reflectance Measurements of Highly Reflecting Optical Coatings of 10.6.mu.", by D. Kelsall, pp. 85-90.

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