Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2005-02-15
2005-02-15
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C356S493000, C356S498000, C356S510000
Reexamination Certificate
active
06856402
ABSTRACT:
An interferometry system includes: i) a first polarizing beam splitter which during operation separates an input beam into a measurement beam and a reference beam; ii) a beam steering element positioned to direct the measurement beam, and not the reference beam, the measurement beam contacting the beam steering element; iii) an interferometer positioned to receive at least a portion of the measurement beam and direct it to a measurement object, which reflects it to define a return measurement beam, and wherein the interferometer is further positioned to receive at least a portion of the reference beam and direct it to a reference object, which reflects it to define a return reference beam; and (iv) an electronic control circuit coupled to the beam steering element. During operation the control circuit adjusts the orientation of the beam steering element in response to changes in the angular orientation of the measurement object. The beam steering element is further positioned to direct the return reference beam, and not the return measurement beam, the return reference beam contacting the beam steering element. The first polarizing beam splitter recombines the return reference beam and the return measurement beam to form an output beam.
REFERENCES:
patent: 4662750 (1987-05-01), Barger
patent: 4711573 (1987-12-01), Wijntjes et al.
patent: 4714339 (1987-12-01), Lau et al.
patent: 4790651 (1988-12-01), Brown et al.
patent: 4802765 (1989-02-01), Young et al.
patent: 5408318 (1995-04-01), Slater
patent: 5491550 (1996-02-01), Dabbs
patent: 5757160 (1998-05-01), Kreuzer
patent: 5781277 (1998-07-01), Iwamoto
patent: 5951482 (1999-09-01), Winston et al.
patent: 6040096 (2000-03-01), Kakizaki et al.
patent: 6252667 (2001-06-01), Hill et al.
patent: 6271923 (2001-08-01), Hill
patent: 6313918 (2001-11-01), Hill et al.
patent: 6330105 (2001-12-01), Rozelle et al.
patent: 6359692 (2002-03-01), Groot
patent: 6541759 (2003-04-01), Hill
patent: 6631004 (2003-10-01), Hill et al.
patent: WO 0017605 (2000-03-01), None
patent: WO 0066969 (2000-11-01), None
Bennett, S.J., “A Double-passed Michelson Interferometer,”Optics Communications, 4:428-430, Feb./Mar. 1972.
Connolly Patrick
Fish & Richardson P.C.
Toatley , Jr. Gregory J.
Zygo Corporation
LandOfFree
Interferometer with dynamic beam steering element does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Interferometer with dynamic beam steering element, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometer with dynamic beam steering element will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3492174