Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1994-03-16
1996-08-06
Gonzalez, Frank
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356346, 356353, 356399, G01B 902
Patent
active
055439160
ABSTRACT:
A wavelength meter for measuring the wavelength of laser light includes a diffraction element for diffracting the light and a glass plate interferometer in light communication with the diffraction element for generating a sinusoidally-shaped interference fringe pattern. The interference fringe pattern is detected by a CCD array which sends a signal representative of the fringe pattern to a computer. The computer filters and analyzes the signal, and corrects the signal for temperature-induced changes in the optical path of the laser light beam. The computer compares the signal with a prestored signal representing a predetermined fringe pattern using a least-squares fit analysis, and from this analysis determines the wavelength of the laser light. An alignment assembly is provided for facilitating directing laser light through the aperture of the diffraction element.
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Catalogue page: Opthos Instruments, Inc., 17805 Caddy Dr. Rockville, MA 20855, The Opthos Wavemeter (Tellurium)--Undated.
Brochure: ILX Lightwave, 920 Technology Blvd., West, Boseman, Montana LWM-6500 Laser Wavelength Meter--Undated.
Advantest Corp.--300 Knightsbridge Parkway, Lincolnshire, Illinois 60069 Jun. 1990--Spec Sheet--Optical Wavelength Meter.
Optical Engineering, Inc. P.O. Box 696, Santa Rosa, CA 95402, Spec Sheet CO.sub.2 Spectrum Analyzer--Undated.
LaserTechnics--Data Sheet--Dec. 1988--Model 100-F Fizeau Wavelength Interferometer.
Catalogue pp. 34-45--Burleigh Technology--Wavemeters Undated--.
Gonzalez Frank
Kim Robert
Rogitz John L.
Science Solutions Inc.
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