Interferometer which corrects for spurious vibrations

Details Interferometer which corrects for spurious vibrations Interferometer which corrects for spurious vibrations

1978-10-10

1979-12-25

Clark, Conrad J.

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, 73657, 356351, G01B 902

Patent

active

041803280

ABSTRACT:
An interferometer which is compensated for the effects of low frequency vibrations in the measuring arm. The resultant changes in optical path length are detected and control signals are applied to an electro-optical device adapted to change the phase of the light in the reference arm of the interferometer relative to that in the measuring arm of the interferometer so as to compensate for the changes of optical path length in the measuring arm of the interferometer.

REFERENCES:
patent: 3482436 (1969-12-01), Neish et al.
patent: 3622794 (1971-11-01), Pond et al.
patent: 3632214 (1972-01-01), Chang
patent: 4027949 (1977-06-01), Lobb

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