Interferometer using integrated imaging array and...

Details Interferometer using integrated imaging array and... Interferometer using integrated imaging array and...

2005-02-01

2005-02-01

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

By light interference

Having polarization

Reexamination Certificate

active

06850329

ABSTRACT:
An integrated imaging element for an interferometer generates at least one image that includes multiple interference portions with different relative phase shifts interleaved in a pattern having a high spatial frequency in the image. The interleaved pattern is at least partially determined by the pattern of a high density polarizing array used in the integrated imaging element. In various embodiments, the multiple interference portions are interleaved in a checkerboard pattern across the entire surface of a detector device. As a result, various non-common mode errors present in various interferometers that generate separate non-interleaved images for each relative phase are reduced or eliminated because multiple phase-shifted interference image information for a small region of an object is provided within a small region on the detector device.

REFERENCES:
patent: 6018393 (2000-01-01), Takishima et al.
patent: 6108131 (2000-08-01), Hansen et al.
patent: 6122103 (2000-09-01), Perkins et al.
patent: 6243199 (2001-06-01), Hansen et al.
patent: 6304330 (2001-10-01), Millerd et al.
patent: 19652113 (1998-06-01), None

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