Interferometer system for making length or angle measurements

Details Interferometer system for making length or angle measurements Interferometer system for making length or angle measurements

1987-11-03

1989-03-21

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356361, G01B 902

Patent

active

048137839

ABSTRACT:
The invention is directed to an interferometer which includes two interferometer systems and with which length measurement or angle measurement as well as index of refraction measurement can be conducted simultaneously. For this purpose, at least one component beam from the measuring arm of the one interferometer system and a component beam from a comparison arm of the other interferometer system are directed through an evacuable arrangement.

REFERENCES:
patent: 4685803 (1987-08-01), Sommargren
Kinder, "Ein Meter-Komparator fur interferometrische Langeubestimmungen in Vakuum-Wellenlangen", Zeiss Wenkzeitschrift, vol. 43, pp. 3-11, 1962.
Grace, "Alaser Calibrator-Compensator to Upgrade the Long-Term Accuracy of a Commerical Laser Interferometer", Proc-SPIE, vol. 24?, pp. 192-199, 1980.

Affiliated with

Also associated with

Rating

Interferometer system for making length or angle measurements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Interferometer system for making length or angle measurements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometer system for making length or angle measurements will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-473608