Interferometer system

Details Interferometer system Interferometer system

1980-03-19

1982-01-12

Corbin, John K.

Optics: measuring and testing

By particle light scattering

With photocell detection

G01B 902

Patent

active

043102450

ABSTRACT:
System for simplifying adjustment of Michelson type interferometers using white light beam to establish point of zero optical path difference in data beam, includes simultaneous adjustment of the white light beam and the data beam with a unitary reflecting surface at the M.sub.1 position, and phasing of the white light beam relative to the data beam by interposition of a transparent optical plate in the white light beam but out of the data beam and providing varying of optical thickness of the white light beam relative to the data beam through rotation of the optical plate.

REFERENCES:
patent: 3708229 (1973-01-01), Pircher
patent: 3936193 (1976-02-01), Auth
patent: 4084907 (1978-04-01), Pinard

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