Interferometer spectrometer with reduced alignment sensitivity

Details Interferometer spectrometer with reduced alignment sensitivity Interferometer spectrometer with reduced alignment sensitivity

2007-01-09

2007-01-09

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

By light interference

Spectroscopy

C356S450000

Reexamination Certificate

active

10309994

ABSTRACT:
An interferometer spectrometer that has reduced alignment sensitivity is described herein. Parallelism of an output ray pair formed by a single input ray is not affected by variations in relative alignment of the components. In comparison to other compensated interferometer designs, lateral separation errors in the output ray pair due to optical component misalignment are reduced. The reduced alignment sensitivity may be accomplished by utilizing simple planar components that are common to both light paths. The reduced alignment sensitivity and simplicity in design provides a more compact and more robust interferometer, with reduced manufacturing costs associated therewith. An elliptical field of view light source that utilizes an array of collimator lenses is also described. The light source provides a more compact design than a single circular collimator lens of the same area, and is suitable for single channel or multi-channel use.

REFERENCES:
patent: 4142797 (1979-03-01), Astheimer
patent: 4654530 (1987-03-01), Dybwad
patent: 4684255 (1987-08-01), Ford
patent: 4830496 (1989-05-01), Young
patent: 4975581 (1990-12-01), Robinson et al.
patent: 5243404 (1993-09-01), Yoshikawa
patent: 5355880 (1994-10-01), Thomas et al.
patent: 5435309 (1995-07-01), Thomas et al.
patent: 5494032 (1996-02-01), Robinson et al.
patent: 5537208 (1996-07-01), Bertram et al.
patent: 5630413 (1997-05-01), Thomas et al.
patent: 5636633 (1997-06-01), Messerschmidt et al.
patent: 5655530 (1997-08-01), Messerschmidt
patent: 5792050 (1998-08-01), Alam et al.
patent: 5808739 (1998-09-01), Turner et al.
patent: 5822136 (1998-10-01), Semrad et al.
patent: 5823951 (1998-10-01), Messerschmidt
patent: 5830132 (1998-11-01), Robinson
patent: 5857462 (1999-01-01), Thomas et al.
patent: 5935062 (1999-08-01), Messerschmidt et al.
patent: 6504614 (2003-01-01), Messerschmidt et al.
patent: 6506614 (2003-01-01), Strassmann
patent: 0 449335 (1991-10-01), None
patent: 0 681 166 (1995-11-01), None
patent: 0 836 083 (1998-04-01), None
Brasunas John C. et al., “Uniform Time-Sampling Fourier Transform Spectroscopy,”Applied Optics,vol. 36, No. 10, Apr. 1, 1997, pp. 2206-2210.
Brault, James W., “New Approach to High-Precision Fourier Transform Spectrometer Design,”Applied Optics,vol. 35, No. 16, Jun. 1, 1996, pp. 2891-2896.
Despain, Alvin M. et al., “A Large-Apperture Field-Widened Interferometer-Spectrometer for Airglow Studies,” Aspen International Conference on Fourier Spectroscopy, 1970, pp. 293-300.
Mertz, Lawrence,Transformation in Optics,John Wiley & Sons, Inc. (1965) pp. 50-51.
Offner, A., “New Concepts in Projection Mask Aligners,”Optical Engineering,vol. 14, No. 2 , Mar.-Apr. 1975, pp. 130-132.
Steel, W.H., “Interferometers for Fourier Spectroscopy,” Aspen International Conference on Fourier Spectroscopy, (1970) pp. 43-53.
Sternberg R.S. et al., “A New Type of Michelson Interference Spectrometer,”Sci. Instrum.,vol. 41 (1964) pp. 225-226.
Tipler, Paul A.,Physics, Second Edition,Worth Publishers, Inc., Chapter 34, Section 34-2, Nov. 1983, pp. 901-908.

Affiliated with

Also associated with

Rating

Interferometer spectrometer with reduced alignment sensitivity does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Interferometer spectrometer with reduced alignment sensitivity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometer spectrometer with reduced alignment sensitivity will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3820560