Interferometer spectrometer having improved scanning reference p

Details Interferometer spectrometer having improved scanning reference p Interferometer spectrometer having improved scanning reference p

1983-03-01

1985-08-27

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

G01B 902

Patent

active

045375089

ABSTRACT:
An interferometer, for use in spectrometry, is disclosed in which a more reliable synchronization of the starting points of successive analytical scans is obtained by combining:

REFERENCES:
patent: 3936193 (1976-02-01), Auth
patent: 4383762 (1983-05-01), Burkert
Steel, "Interferometers for Fourier Spectroscopy", Proc. Aspen Conference on Fourier Transform Spectroscopy, pp. 43-53.

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