Interferometer for measuring optical phase differences

Details Interferometer for measuring optical phase differences Interferometer for measuring optical phase differences

1988-03-07

1989-10-10

McGraw, Vincent P.

Optics: measuring and testing

By polarized light examination

With birefringent element

G01B 902

Patent

active

048727555

ABSTRACT:
For generating several interferograms which differ from each other in the relative phase position between the interfering partial beams, a light source is utilized having a coherence length less than the optical path difference between the two component beams in the measuring path of the interferometer. Furthermore, at least one optical delay device is provided which splits the beam into two component beams and which generates an optical path difference between these component beams which is approximately the same as the optical path difference of the partial beams in the measuring path of the interferometer. Thereafter, the delay device again unites the component beams congruently.

REFERENCES:
patent: 4360271 (1982-11-01), Downs et al.
patent: 4596466 (1986-06-01), Ulrich
"Direct Measurement of Phase in a Spherical-Wave Fizeau Interferomenter" by R. C. Moore and F. H. Slaymaker, (Applied Optics, vol. 19, No. 13, 7-1-1980, pp. 2196 to 2200.
"Instantaneous Phase Measuring Interferometry" by R. Smythe and R. Moore, (Optical Engineering, Jul.-Aug. 1984, vol. 23, No. 4, pp. 361 to 364).

Affiliated with

Also associated with

Rating

Interferometer for measuring optical phase differences does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Interferometer for measuring optical phase differences, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometer for measuring optical phase differences will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1953594