X-ray or gamma ray systems or devices – Specific application – Holography or interferometry
Reexamination Certificate
2011-04-12
2011-04-12
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Holography or interferometry
C378S082000
Reexamination Certificate
active
07924973
ABSTRACT:
The present invention discloses an interferometer device and method. In embodiments, the device comprises an electromagnetic radiation source emitting radiation having a first mean wavelength λLE; a phase grating having a first aspect ratio; an absorption grating having a second aspect ratio; and a detector. The electromagnetic radiation source, the phase grating, the absorption grating and the detector are radiatively coupled with each other. The absorption grating is positioned between the detector and the phase grating; the electromagnetic radiation source is positioned in front of the source grating; and wherein the phase grating is designed such to cause a phase shift that is smaller than π on the emitted radiation. Additional and alternative embodiments are specified and claimed.
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Kaufmann Rolf
Kottler Christian
Bianco Paul D.
CSEM - Centre Suisse d'Electronique et de Microtechnique SA
Fleit Martin
Fleit Gibbons Gutman Bongini & Bianco PL
Kiknadze Irakli
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