Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1995-06-07
1998-10-20
Font, Frank G.
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, 359871, 359881, G01B 902
Patent
active
058254900
ABSTRACT:
An interferometer comprising a base forming an interior, and first and second optical members located in the interior of the base. The interferometer further comprises a first retainer assembly connecting the first optical member to the base, translation means for moving the second optical member relative the first optical member to vary the distance between the first and second optical members, and a second retainer assembly connecting the second optical member to the translation means. The preferred mechanical configuration and design features of the interferometer produce a very durable instrument that can rapidly scan and accurately filter light across a wide bandwidth. This uniquely designed instrument combines high speed switching, high resolution, wide bandwidth, and adjustable damping capabilities in a durable flight capable instrument.
REFERENCES:
patent: 3229224 (1966-01-01), Waly et al.
patent: 3814507 (1974-06-01), Osborn et al.
Haas Edwin G.
Hilgeman Theodore W.
Ryan Robert E.
Anderson Terry J.
Font Frank G.
Hoch Jr. Karl J.
Merlino Amanda
Northrop Grumman Corporation
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