Interferometer calibration methods and apparatus

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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C359S579000

Reexamination Certificate

active

11426543

ABSTRACT:
A Fabry-Perot (FP) interferometer includes substantially parallel first and second reflecting surfaces spaced apart by an optical gap between the first and second reflecting surfaces. The FP interferometer also has a mechanism for controlling the optical gap. The mechanism includes a plurality of electrostatic control plates. Each electrostatic control plate has a fixed control-plate area. Each control plate is adapted to control the optical gap by application of a control-plate voltage. The control-plate areas are related by integral ratios.

REFERENCES:
patent: 4558950 (1985-12-01), Ulrich et al.
patent: 4618261 (1986-10-01), Flanders et al.
patent: 4859060 (1989-08-01), Katagiri et al.
patent: 5550373 (1996-08-01), Cole et al.
patent: 5771321 (1998-06-01), Stern
patent: 5835255 (1998-11-01), Miles
patent: 5986796 (1999-11-01), Miles
patent: 6040937 (2000-03-01), Miles
patent: 6154591 (2000-11-01), Kershaw
patent: 6341039 (2002-01-01), Flanders et al.
patent: 6373632 (2002-04-01), Flanders
patent: 6392341 (2002-05-01), Jacobsen et al.
patent: 6504616 (2003-01-01), Haber et al.
patent: 6542523 (2003-04-01), Funakawa
patent: 6674562 (2004-01-01), Miles
patent: 6710908 (2004-03-01), Miles et al.
patent: 6744524 (2004-06-01), Kogan et al.
patent: 6836366 (2004-12-01), Flanders et al.
patent: 7002696 (2006-02-01), Miron
patent: 2001/0055119 (2001-12-01), Wood et al.
patent: 2002/0015215 (2002-02-01), Miles
patent: 2002/0024711 (2002-02-01), Miles
patent: 2002/0033951 (2002-03-01), Hill
patent: 2002/0036828 (2002-03-01), Wong
patent: 2002/0054424 (2002-05-01), Miles
patent: 2002/0126364 (2002-09-01), Miles
patent: 2002/0126725 (2002-09-01), Tayebati
patent: 2003/0072009 (2003-04-01), Domash et al.
patent: 2003/0098982 (2003-05-01), McLeod et al.
patent: 2003/0165166 (2003-09-01), Funakawa
patent: 2004/0070768 (2004-04-01), McDaniel et al.
patent: 2004/0125281 (2004-07-01), Lin
Eugene Hecht, “Optics” Fourth Ed., Addison-Wesly, San Francisco, CA (2002), pp. 421-425.

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