Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1980-02-25
1982-03-16
Evans, F. L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356349, 356363, G01B 902
Patent
active
043198430
ABSTRACT:
A dual beam interferometer in which the motion of a mirror produces optical path variation resulting in fringes at photodetectors provides direct, selectable measurement of wavelength and frequency of an input laser beam with high accuracy and over a large frequency and wavelength range without the need for correction due to differences in the index of refraction over the range.
REFERENCES:
patent: 4052129 (1977-10-01), Schawlow et al.
patent: 4165183 (1979-08-01), Hall et al.
Kowalski et al., Journal of the Optical Society of America, vol. 66, No. 9, Sep. 1976, pp. 965 and 966.
Kowalski et al., Journal of the Optical Society of America, vol. 68, No. 11, Nov. 1978, pp. 1611-1613.
Salimbeni et al., Optics Letters, vol. 5, No. 2, Feb. 1980, pp. 39-41.
Rowley, IEEE Transactions on Instrumentation and Measurement, vol. IM-15, No. 4, Dec. 1966, pp. 146-149.
Baldwin et al., Hewlett-Packard Journal, Dec. 1971, pp. 14-20.
Bukovskii et al., Pribory i Tekhnika Eksperimenta, No. 3, May-Jun. 1974, pp. 175-177.
Hall et al., Applied Physics Letters vol. 29, 1976, pp. 367-369.
Burleigh Instruments Inc.
Evans F. L.
Lukacher Martin
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