Interferometer alignment system utilizing a step calibration

Details Interferometer alignment system utilizing a step calibration Interferometer alignment system utilizing a step calibration

1996-02-29

1998-10-20

Kim, Robert

Optics: measuring and testing

By particle light scattering

With photocell detection

356346, G01B 902

Patent

active

058254919

ABSTRACT:
An interferometer comprises a source of radiation (10) and a beam splitter (12) for forming two beams. The beams travel along different optical paths and the optical path difference of the paths can be varies by rotatable mirror pairs M2/M3 and M4/M5. One of the paths includes an adjustable mirror M6 which is tiltable in orthogonal directions. A control unit (18) can be automatically initiate periodically an alignment procedure for aligning the interferometer.

REFERENCES:
patent: 4053231 (1977-10-01), Fletcher et al.
patent: 4684255 (1987-08-01), Ford
Soviet Journal Of Optical Technology, vol. 54, No. 2, Feb. 1987, New York, US pp. 110-111, V.I. Erashov, "An Automatic Alignment System for a Fourier Spectrometer".

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