Optics: measuring and testing – With plural diverse test or art
Patent
1998-06-16
1999-08-31
Kim, Robert H.
Optics: measuring and testing
With plural diverse test or art
25022723, G01N 2322
Patent
active
059460822
ABSTRACT:
An improved method for minimizing interferences from random noise and correlated fluctuations which obscure electrical signals converted from optical emissions. In particular, an improved method for the removal of interferences from optical emission signals during endpoint determination in dry etching processes for the fabrication of micro-electronic devices which derives information in the presence of random noise, correlated fluctuations and periodic modulations of the plasma by maximizing the signal to random noise ratio and minimizing the obscuring effects of correlated fluctuation.
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Leach Steven C.
Litvak Herbert E.
Rodgers Edward G.
Kim Robert H.
Luxtron Corporation
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