Interference removal

Optics: measuring and testing – With plural diverse test or art

Patent

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Details

20419232, 20419234, 25022723, G01N 2322

Patent

active

054145040

ABSTRACT:
An improved method for minimizing interferences from random noise and correlated fluctuations which obscure electrical signals converted from optical emissions. In particular, an improved method for the removal of interferences from optical emission signals during endpoint determination in dry etching processes for the fabrication of microelectronic devices which derives information in the presence of random noise, correlated fluctuations and periodic modulations of the plasma by maximizing the signal to random noise ratio and minimizing the obscuring effects of correlated fluctuation.

REFERENCES:
patent: 4611919 (1986-09-01), Brooks, Jr. et al.

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