Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2006-07-20
2010-06-22
Nguyen, Thong (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S368000, C359S385000
Reexamination Certificate
active
07742226
ABSTRACT:
The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4π microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.
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Bewersdorf Joerg
Gugel Hilmar
Leica Microsystems CMS GmbH
Leydig , Voit & Mayer, Ltd.
Nguyen Thong
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