Interference device and method for observing phase informalities

Details Interference device and method for observing phase informalities Interference device and method for observing phase informalities

1993-08-10

1995-08-29

Gonzalez, Frank

Optical: systems and elements

Light interference

250307, G02B 2606

Patent

active

054465893

ABSTRACT:
An interference device and method for observing phase information, using electron or other waves with the amplitude difficult to split by a half mirror. Using an interference device comprising in combination two scattering films A1 and A2 capable of scattering incident waves randomly, first lens systems B1 and B2 that are located between said two scattering films to form the image of one scattering film A1 on the other scattering film A2, a second lens system B3 for forming on an observation surface C the image of a specimen 2 located at a position where a component going straight through said one scattering film is converged in a spot form through said first lens system or a part thereof, and means for recording an interference pattern formed on the observation surface C, an interference pattern is detected while the specimen 2 is inserted in the arrangement, and an interference pattern is detected while the specimen 2 is removed from the arrangement, so that the difference between both the interference patterns, or the sum or product of them, can be found to observe the phase information of the specimen directly as interference fringes.

REFERENCES:
patent: 4038543 (1977-07-01), Krisch et al.
patent: 4935625 (1990-06-01), Hasegawa et al.
patent: 5298747 (1994-03-01), Ichikawa et al.
patent: 5300776 (1994-04-01), Krivanek

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