Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-01-14
1995-04-04
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, 356358, G01B 902
Patent
active
054042224
ABSTRACT:
An improved interferometric measuring system wherein the system projects a first beam of light at a first measurement wavelength along a reference path to a reference reflector and a second beam of light at a second measurement wavelength along a measurement path to a measurement reflector, and determines a change in position of the measurement reflector from an interference pattern produced between a first light beam reflected from the reference reflector and a second light beam reflected from the measurement reflector, and wherein the system can measure atmospheric disturbances along the measurement path, concurrently with measuring a change in the position of the measurement reflector.
REFERENCES:
patent: 3458259 (1969-07-01), Bagley et al.
patent: 3656853 (1972-04-01), Bagley et al.
patent: 3788746 (1974-01-01), Baldwin et al.
patent: 3790284 (1974-02-01), Baldwin
patent: 3877813 (1975-04-01), Hayes et al.
patent: 4072422 (1978-02-01), Tanaka et al.
patent: 4215938 (1980-08-01), Farrand et al.
patent: 4295741 (1981-10-01), Palma et al.
patent: 4465372 (1984-08-01), Geary
patent: 4594003 (1986-06-01), Sommargren
patent: 4632554 (1986-12-01), Pearce
patent: 4684828 (1987-08-01), Sommargren
patent: 4688940 (1987-08-01), Sommargren et al.
patent: 4693605 (1987-09-01), Sommargren
patent: 4711574 (1987-12-01), Baldwin
patent: 4717250 (1988-01-01), Sommargren
patent: 4733967 (1988-03-01), Sommargren
patent: 4746216 (1988-05-01), Sommargren
patent: 4752133 (1988-06-01), Sommargren
patent: 4784489 (1988-11-01), Cutler et al.
patent: 4784490 (1988-11-01), Wayne
patent: 4787747 (1988-11-01), Sommargren et al.
patent: 4802764 (1989-02-01), Young et al.
patent: 4802765 (1989-02-01), Young et al.
patent: 4807997 (1989-02-01), Sommargren
patent: 4832489 (1989-05-01), Wyant et al.
patent: 4859066 (1989-08-01), Sommargren
patent: 4881815 (1989-11-01), Sommargren
patent: 4881816 (1989-11-01), Zanoni
patent: 4883357 (1989-11-01), Zanoni et al.
patent: 4886363 (1989-12-01), Jungquist
patent: 4906095 (1990-03-01), Johnston
patent: 4907886 (1990-03-01), Dandliker
patent: 4930894 (1990-06-01), Baldwin
patent: 4948254 (1990-08-01), Ishida
patent: 4950078 (1990-08-01), Sommargren
patent: 4969017 (1990-11-01), Lefevre et al.
patent: 4984898 (1991-01-01), Hofler et al.
patent: 5004914 (1991-04-01), Vali et al.
patent: 5127735 (1992-07-01), Pitt
patent: 5133599 (1992-07-01), Sommargren
patent: 5146284 (1992-09-01), Tabarelli et al.
patent: 5153669 (1992-10-01), DeGroot
patent: 5172185 (1992-12-01), Leuchs et al.
patent: 5172186 (1992-12-01), Hosoe
patent: 5187543 (1993-02-01), Ebert
patent: 5280341 (1994-01-01), Nonnenmacher et al.
Dukes et al. (1970) "A Two-Hundred-Food Yardstick with Graduations Every Microinch", Hewlett-Packard J., 21:203-209.
Johnson et al. (1977) "Phase-Locked Interferometry", Clever Optics, SPIE Proc., 126:152-160.
Hopf et al. (1980) "Second-harmonic interferometers", Optics Letters, 5:487-489.
Baldwin et al. (Apr. 1983) "Laser Optical Components for Machine Tool and Other Calibrations", Hewlettt-Packard J., pp. 14-22.
Quenelle et al. (Apr. 1983) "A New Microcomputer-Controlled Laser Dimensional Measurement and Analysis System", Hewlett-Packard J., pp. 3-13.
Siddall et al. (1987), Martinus Nijhoff publication Optical Metrology (Coherent and Incoherent Optics for Metrology, Sensing and Control in Science, Industry and Biomedicine) "Some Recent Developments in Laser Interferometry" (Oliverio D. D. Soares, Porto, Portugal, eds.), published in cooperation with NATO Scientific Affairs Div., pp. 69-83.
Eisenberg Jason D.
Sparta, Inc.
Turner Samuel A.
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