Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-06-06
2006-06-06
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C324S754090
Reexamination Certificate
active
07057410
ABSTRACT:
An interface structure for use in a semiconductor integrated circuit tester for connecting a test head interface to a DUT interface includes a first frame member having first and second opposite main faces, a second frame member having first and second opposite main faces, and a spacer securing the first and second frame members together in spaced relationship. A first cable assembly header is received in an aperture of the first frame member and includes a conductive element and electrically conductive terminal members exposed at a main face of the first frame member and electrically insulated from the conductive element of the first header. A second cable assembly header is received in an aperture of the second frame member and includes a conductive element and electrically conductive terminal members exposed at a main face of the second frame member and electrically insulated from the conductive element of the second header. Coaxial cables connect each terminal member of the first header to a corresponding terminal member of the second header.
REFERENCES:
patent: 6166553 (2000-12-01), Sinsheimer
patent: 6377062 (2002-04-01), Ramos et al.
patent: 6420888 (2002-07-01), Griffin et al.
patent: 6624646 (2003-09-01), Zaiser
patent: 6744267 (2004-06-01), Sauk et al.
Hannan James M.
Harsany John J.
Jordan James R.
Wohlfarth Paul Dana
Bedell Daniel J.
Credence Systems Corporation
Nguyen Vinh
Smith-Hill and Bedell
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