Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-03-04
1999-08-31
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324755, G01R 102, G01R 104
Patent
active
059458372
ABSTRACT:
An interface structure for providing connections between integrated circuit (IC) devices and a device tester. The interface structure includes a printed circuit board having one or more groups of pogo pins, each group being arranged to contact the pins extending from the pin grid array package of one IC device, and includes interconnect paths from the pogo pins and the device tester. The groups of pogo pins are mounted directly into the printed circuit board in a universal footprint arrangement that is customized to receive a plurality of different pin grid array package footprints. A nonconductive cover plate is mounted over the pogo pin groups upon which the IC devices are mounted by a handler. A mother board is connected between the printed circuit board and the device tester.
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Bever Patrick T.
Nguyen Vinh P.
Xilinx , Inc.
Young Edel M.
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