Interface for testing semiconductors

Details Interface for testing semiconductors Interface for testing semiconductors

2011-03-01

2011-03-01

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

07898281

ABSTRACT:
A system includes an imaging device for capturing a video sequence and a display for displaying the video in a window of the display and effectively positioning a probe relative to probe pads of a device under test for testing a semiconductor wafer supported by a support of a probing environment.

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