Interface comprising a thin PCB with protrusions for testing...

Details Interface comprising a thin PCB with protrusions for testing... Interface comprising a thin PCB with protrusions for testing...

2006-10-24

2006-10-24

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07126364

ABSTRACT:
The invention relates to a test device for testing an integrated circuit called test circuit, comprising a plurality of housings intended to be tested in a printed circuit called main circuit. The device comprises an insulating membrane of soft material having two opposite surfaces covered by two conductive layers interconnected by via holes and intended to be in contact with the test circuit and the main circuit respectively, under the influence of a pressure exerted during the test between the test circuit and the main circuit pressing the test device. Protrusions are arranged on at least one of the two layers in a predefined pattern as a function of said pins, tabs, pads etc. of the test circuit so as to ensure a contact quality between said layer and the circuit (to be tested or the main circuit) having contact with said layer under the influence of said pressing action.

REFERENCES:
patent: 5529504 (1996-06-01), Greenstein et al.
patent: 5828226 (1998-10-01), Higgins et al.
patent: 5966022 (1999-10-01), Budnaitis et al.
patent: 6029344 (2000-02-01), Khandros et al.
patent: 6676438 (2004-01-01), Zhou et al.
patent: 6981880 (2006-01-01), Brodsky et al.
patent: 2002/0039847 (2002-04-01), Clayton

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