Interface apparatus for semiconductor device tester

Details Interface apparatus for semiconductor device tester Interface apparatus for semiconductor device tester

2006-05-16

2006-05-16

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S073100

Reexamination Certificate

active

07046027

ABSTRACT:
A signal interface to connect a semiconductor tester to a device under test. The Interface includes a generic component and customized component. The generic component includes multiple copies of electronic elements that can be connected in signal paths between the tester and the device under test. The customized component is constructed for a specific device under test and provides connections between generic contact points on the generic component and test points on the device under test. In addition, the customized component has conductive members that can be used to interconnect the electronic elements on the generic component. The connections configure the electronic elements into signal conditioning circuitry, thereby providing signal paths through the interface that are compatible with the I/O characteristics of specific test points on a device under test. The generic and the customized components may be fabricated on semiconductor wafers.

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