Interface apparatus for integrated circuit testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07141993

ABSTRACT:
An apparatus and method for coupling a test head and probe card in an IC testing system incorporating patterned divider elements (24) disposed between rows of signal conductors (22) to provide matching characteristic impedance values along each row of signal conductors. The divider elements have a patterned conductive layer formed thereon that is electrically connected to ground, and a method for determining a useful pattern is provided. Test dividers (24) fabricated with openings of various size and shape are used to construct transmission lines. The impedance of these lines is measured, and the results are used to interpolate an appropriate opening size and shape to achieve a desired transmission line impedance.

REFERENCES:
patent: 4931726 (1990-06-01), Kasukabe et al.
patent: 5384555 (1995-01-01), Wilson et al.
patent: 5525911 (1996-06-01), Marumo et al.
patent: 5534787 (1996-07-01), Levy
patent: 5912597 (1999-06-01), Inagawa et al.
patent: 6111205 (2000-08-01), Leddige et al.
patent: 6130585 (2000-10-01), Whybrew et al.
patent: 6133805 (2000-10-01), Jain et al.
patent: 6160412 (2000-12-01), Martel et al.
patent: 6259260 (2001-07-01), Smith et al.
patent: 6420888 (2002-07-01), Griffin et al.
patent: 0 977 045 (2000-02-01), None
International Search Report for PCT Application No. PCT/US02/20891 mailed Feb. 11, 2003.

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