Interconnect structures with interlayer dielectric

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration

Reexamination Certificate

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Details

C257S775000, C257S776000, C438S618000, C438S622000, C438S637000, C438S672000

Reexamination Certificate

active

07659630

ABSTRACT:
The present invention relates to metallic interconnect having an interlayer dielectric thereover, the metallic interconnect having an upper surface substantially free from oxidation. The metallic interconnect may have an exposed upper surface thereon that is passivated by a nitrogen containing compound.

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