Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration
Reexamination Certificate
2007-08-20
2010-02-09
Le, Dung A. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified configuration
C257S775000, C257S776000, C438S618000, C438S622000, C438S637000, C438S672000
Reexamination Certificate
active
07659630
ABSTRACT:
The present invention relates to metallic interconnect having an interlayer dielectric thereover, the metallic interconnect having an upper surface substantially free from oxidation. The metallic interconnect may have an exposed upper surface thereon that is passivated by a nitrogen containing compound.
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Hougen et al., “Chapter 10: Adsorption,” Chemical Process Principles, Second Edition, John Wiley and Sons, Inc. (1954), pp. 368-393.
Jost Mark E.
Yin Zhiping
Le Dung A.
Micro)n Technology, Inc.
TraskBritt
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