Interconnect structure with air gap compatible with unlanded...

Details Interconnect structure with air gap compatible with unlanded... Interconnect structure with air gap compatible with unlanded...

2001-05-04

2002-12-10

Chaudhuri, Olik (Department: 2813)

Active solid-state devices (e.g., transistors, solid-state diode

Combined with electrical contact or lead

Of specified material other than unalloyed aluminum

C257S760000

Reexamination Certificate

active

06492732

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of Invention
The present invention relates to an integrated circuit structure. More particularly, the present invention relates to an interconnect structure with an air gap.
2. Description of Related Art
Modern integrated circuits include devices such as field effect transistor (FETs) or bipolar devices formed in and on a semiconductor substrate in combination with a multilevel interconnect structure formed above and in contact with the devices. The multilevel interconnect structure provides connections to and between different ones of the devices formed in the substrate and so is an increasingly important aspect of aggressive designs for integrated circuits. In many integrated circuits, the multilevel interconnect structure includes one or more arrays of wiring lines extending in parallel to provide connections to and between the devices in closely packed arrays of devices. Such arrays of devices are typical of integrated circuit memories and other aggressive circuit designs. Closely spaced, parallel wiring lines can provide undesirable levels of capacitive and inductive coupling between adjacent wiring lines, particularly for higher data transmission rates through the arrays of parallel wiring lines. Such capacitive and inductive coupling slow data transmission rates and increase energy consumption in a manner that can limit the performance of the integrated circuits. For some aggressive circuit designs, the delays and energy consumption associated with the circuit's interconnect structure are a significant limitation on the circuit's performance.
The complexity of modem interconnect structures has become a major cost component for integrated circuit designs. Various factors threaten to further increase the proportional expense of the interconnect structure within integrated circuits. For example, proposals have been advanced for substituting different interlayer and inter-metal dielectric materials into multilevel interconnect structures to improve the coupling problem. The capacitive and inductive coupling between adjacent wiring lines is mediated by the dielectric material that separates the wiring lines. Present dielectric materials, such as silicon oxides deposited by chemical vapor deposition (CVD) from TEOS source gases, have comparatively high dielectric constant, and proposals have been made to replace these dielectric materials with dielectric materials having lower dielectric constant. Performance could be improved by replacing the higher dielectric constant materials with lower dielectric constant materials, with the theoretical minimum dielectric constant being provided by a gas or vacuum dielectric. Adoption of these alternate dielectric materials has not been completely satisfactory to this point in time, due to the increased cost and processing difficulty associated with these alternative materials.
One promising implementation of a multilevel interconnect structure using an air dielectric, that is, air gap is proposed.
FIG. 1
is a cross-sectional view, schematically illustrating a typical interconnect structure with an air gap design. In
FIG. 1
, the substrate
10
has various devices (not shown). A dielectric layer
12
is formed over the substrate
10
. First level wiring lines
20
,
22
extend along the surface of the dielectric layer
12
and are separated by air gaps
32
. The use of air gaps, as compared to more conventional dielectric materials, ensures that there is a minimal level of coupling between the adjacent first level wiring lines
20
,
22
. The first level air gaps are bounded on the bottom by the dielectric layer
12
and on the top by a thin layer of silicon oxide
30
. Contacts to the first level wiring lines
20
include vertical interconnects
36
that extend from the first level wiring lines
22
to the second level wiring lines
46
. The first level wiring lines
22
and the second level wiring lines
46
are connected by the vertical interconnects
36
in between, where the inter-metal dielectric layer
42
separates the first level wiring lines
22
and the second level wiring lines
46
. These via level air gaps reduce the extent of capacitive and inductive coupling between the first level wiring level wiring lines
20
,
22
and the second level wiring lines
46
, as compared to more conventional solid dielectric materials. In a similar fashion, second level air gaps
52
, bounded on top and bottom by thin layers of silicon oxide
49
,
40
, are provided between the second level wiring lines
46
to reduce the level of capacitive and inductive coupling between the second wiring lines. Air gaps
32
,
52
surround the wiring lines
20
,
22
,
46
.
In order to fabricate the structure as shown in
FIG. 1
, a sequence of processes in cross-sectional view is shown in
FIGS. 2-5
. In
FIG. 2
, a carbon layer
14
is formed on the dielectric layer
12
. The carbon layer
14
is patterned by photolithography and etching process, so as to form openings
16
that expose the dielectric layer. The location of the openings
16
is the location where an wiring lines, such as the wiring lines
20
,
22
of
FIG. 1
, is to be formed.
In
FIG. 3
, the openings
16
are filled with metal material by a typical damascene manner, so as to form the wiring lines
20
,
22
. The damascene manner typically includes depositing a blanket metal layer over the carbon layer
14
, and polishing away the top portion of the metal layer. The residual metal layer fills the openings
16
to form the wiring lines
20
,
22
.
In
FIG. 4
, a thin silicon oxide layer
30
is formed to cover the carbon layer
14
and the wiring lines
20
,
22
. The substrate
10
with the carbon layer covered by the silicon oxide layer
30
is placed in a furnaces holding an oxygen ambient and heated to a temperature of 400° C.-500° C. for approximately two hours. In this environment, oxygen readily diffuses through the thin oxide layer
30
to react with the carbon layer
14
, forming CO
2
which diffuses back through the thin oxide layer and escapes. After two hours ashing period, the entire carbon layer
14
is consumed, leaving behind air gaps
32
between the oxide layer
30
and the dielectric layer
12
and separating the first level wiring lines
20
,
22
, as shown in FIG.
4
. This process can then be repeated to produce the multilevel interconnect structure shown in
FIG. 5
, which is also the structure shown in FIG.
1
. The via interconnects
36
in the inter-metal dielectric layer
42
is formed to connect to a next level interconnect
46
that are to be formed. The second level interconnect
46
is continuously formed by repeating similar process of depositing and patterning the carbon layer, and filling the interconnect
46
. The silicon oxide layer
49
is formed covering the carbon layer
52
and the second level interconnect
46
, such as the wiring lines. The carbon is evaporated away to leave the air gap
44
.
In the conventional interconnect structure as shown in
FIG. 1
, the air gap is included. This can effectively reduce the capacitance of the interconnect dielectric layer. However, if a misalignment occurs during forming openings for the wiring lines, an unlanded via or wiring line would be formed. This is often when the device integration greatly increases. In this situation, the unlanded opening may also penetrate through the thin silicon oxide layers
30
,
40
,
49
, and improperly expose the air gaps. When the material for via or wiring line to deposited into the unlanded opening, the material also enters the air gap, causing a failure of the device.
SUMMARY OF THE INVENTION
As embodied and broadly described herein, the invention provides an interconnect structure with air gap. A conductive structure, such as an unlanded via or a wiring line, can be formed without improperly penetrating into an undesired region of the interconnect structure.
The interconnect structure includes a substrate which has devices already formed thereon. A dielectric layer covers over the substrate. A conductive structure encl

Affiliated with

Also associated with

Rating

Interconnect structure with air gap compatible with unlanded... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Interconnect structure with air gap compatible with unlanded..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interconnect structure with air gap compatible with unlanded... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2934274