Interconnect structure and method of forming

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257760, H01L 2348, H01L 2352, H01L 2940

Patent

active

058083626

ABSTRACT:
A graded-channel semiconductor device (10) is formed in a pedestal (12). The pedestal (12) is formed on a substrate (11) and improves the electrical characteristics of the device (10) compared to conventional device structures. The pedestal (12) has sides (13) that are bordered by a first dielectric layer (24) to provide electrical isolation. An interconnect structure (90) can be optionally formed in conjunction with the formation of the device (10). The interconnect structure (90) has a plurality of conductors (60,97) that can be used to transport electrical signals across the device (10).

REFERENCES:
patent: 4974056 (1990-11-01), Brodsky et al.
patent: 5108945 (1992-04-01), Matthews
patent: 5243220 (1993-09-01), Shibata et al.
patent: 5262655 (1993-11-01), Ashida
patent: 5369303 (1994-11-01), Wei
patent: 5612557 (1997-03-01), Hondo et al.
patent: 5633522 (1997-05-01), Dorleans et al.
patent: 5670794 (1997-09-01), Manning
patent: 5708303 (1998-01-01), Jeng

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Interconnect structure and method of forming does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Interconnect structure and method of forming, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interconnect structure and method of forming will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-91485

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.