Interconnect structure and method of fabricating the same

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

Reexamination Certificate

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Details

C427S097100, C427S098500, C427S249100, C427S554000, C427S555000, C204S192150

Reexamination Certificate

active

07858147

ABSTRACT:
A method of fabricating an interconnect structure is described. A substrate is provided. A patterned interfacial metallic layer is formed on the substrate. An amorphous carbon insulating layer or a carbon-based insulating layer is formed covering the substrate and the interfacial metallic layer. A conductive carbon line or plug is formed in the amorphous carbon or carbon-based insulating layer electrically connected with the interfacial metallic layer. An interconnect structure is also described, including a substrate, a patterned interfacial metallic layer on the substrate, an amorphous carbon insulating layer or a carbon-based insulating layer on the substrate, and a conductive carbon line or plug disposed in the amorphous carbon or carbon-based insulating layer and electrically connected with the interfacial metallic layer.

REFERENCES:
patent: 7094679 (2006-08-01), Li et al.
patent: 7312531 (2007-12-01), Chang et al.
patent: 2008/0159945 (2008-07-01), Chen et al.
patent: 2005-231952 (2005-09-01), None

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