Intelligent probe card architecture

Details Intelligent probe card architecture Intelligent probe card architecture

2007-12-11

2007-12-11

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

10828755

ABSTRACT:
A probe card for a wafer test system is provided with a number of on board features enabling fan out of a test system controller channel to test multiple DUTs on a wafer, while limiting undesirable effects of fan out on test results. On board features of the probe card include one or more of the following: (a) DUT signal isolation provided by placing resistors in series with each DUT input to isolate failed DUTs; (b) DUT power isolation provided by switches, current limiters, or regulators in series with each DUT power pin to isolate the power supply from failed DUTs; (c) self test provided using an on board micro-controller or FPGA; (d) stacked daughter cards provided as part of the probe card to accommodate the additional on board test circuitry; and (e) use of a interface bus between a base PCB and daughter cards of the probe card, or the test system controller to minimize the number of interface wires between the base PCB and daughter cards or between the base PCB and the test system controller.

REFERENCES:
patent: 4658209 (1987-04-01), Page
patent: 5091692 (1992-02-01), Ohno et al.
patent: 5550480 (1996-08-01), Nelson et al.
patent: 5875198 (1999-02-01), Satoh
patent: 5996102 (1999-11-01), Haulin
patent: 6351134 (2002-02-01), Leas et al.
patent: 6380753 (2002-04-01), Iino et al.
patent: 6400173 (2002-06-01), Shimizu et al.
patent: 6603323 (2003-08-01), Miller
patent: 6798225 (2004-09-01), Miller
patent: 6856150 (2005-02-01), Sporck et al.
patent: 2002/0105352 (2002-08-01), Mori et al.
patent: 2002/0145437 (2002-10-01), Sporck et al.
patent: 2003/0074611 (2003-04-01), Nachumovsky
patent: 2003/0115517 (2003-06-01), Rutten
patent: 2003/0210069 (2003-11-01), Kikuchi et al.
patent: 2004/0008024 (2004-01-01), Miller
patent: 2004/0075453 (2004-04-01), Slupsky
U.S. Appl. No. 10/693,133, filed Oct. 23, 2003, Charles A. Miller.

Affiliated with

Also associated with

Rating

Intelligent probe card architecture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Intelligent probe card architecture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Intelligent probe card architecture will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3881432