Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2007-09-11
2007-09-11
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S509000, C361S045000
Reexamination Certificate
active
11588046
ABSTRACT:
An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit. In one embodiment, the apparatus a trip mechanism state generator, a fault alarm generator, a ground fault simulation unit. In operation, the ground fault simulation unit generates a simulated ground fault signal during every positive half-wave of an AC power, the simulated ground fault signal is detected by the leakage current detection circuit, the leakage current detection circuit responsively generates a signal to turn a switching device into its conductive state so as to allow a current to pass therethrough, the passed current is converted into a DC voltage in accordance with a trip mechanism state generated by the trip mechanism state generator, the fault alarm circuit receives and analyzes the DC voltage and indicates whether a fault exists in the leakage current protection device.
REFERENCES:
patent: 4931894 (1990-06-01), Legatti
patent: 4979070 (1990-12-01), Bodkin
patent: 5053931 (1991-10-01), Rushing
patent: 5223810 (1993-06-01), Van Haaren
patent: 5229730 (1993-07-01), Legatti et al.
patent: 5334939 (1994-08-01), Yarbrough
patent: 5363269 (1994-11-01), McDonald
patent: 5418678 (1995-05-01), McDonald
patent: 5448443 (1995-09-01), Muelleman
patent: 5477412 (1995-12-01), Neiger et al.
patent: 5541800 (1996-07-01), Misencik
patent: 5642248 (1997-06-01), Campolo et al.
patent: 5654857 (1997-08-01), Gershen
patent: 5661623 (1997-08-01), McDonald et al.
patent: 5673360 (1997-09-01), Scripps
patent: 5684272 (1997-11-01), Gernhardt et al.
patent: 5706155 (1998-01-01), Neiger et al.
patent: 5729417 (1998-03-01), Neiger et al.
patent: 5757598 (1998-05-01), Aromin
patent: 5786971 (1998-07-01), Chan et al.
patent: 5825599 (1998-10-01), Rosenbaum
patent: 5841615 (1998-11-01), Gershen
patent: 5899761 (1999-05-01), Crane et al.
patent: 5906517 (1999-05-01), Crane et al.
patent: 5963406 (1999-10-01), Neiger et al.
patent: 5963408 (1999-10-01), Neiger et al.
patent: 6021034 (2000-02-01), Chan et al.
patent: 6040967 (2000-03-01), DiSalvo
patent: 6052265 (2000-04-01), Zaretsky et al.
patent: 6052266 (2000-04-01), Aromin
patent: 6128169 (2000-10-01), Neiger et al.
patent: 6226161 (2001-05-01), Neiger et al.
patent: 6246558 (2001-06-01), DiSalvo et al.
patent: 6252407 (2001-06-01), Gershen
patent: 6259340 (2001-07-01), Fuhr et al.
patent: 6262871 (2001-07-01), Nemir et al.
patent: 6282070 (2001-08-01), Ziegler et al.
patent: 6292337 (2001-09-01), Legatti et al.
patent: 6339525 (2002-01-01), Neiger et al.
patent: 6381112 (2002-04-01), DiSalvo
patent: 6381113 (2002-04-01), Legatti
patent: 6407469 (2002-06-01), Cline et al.
patent: 6407893 (2002-06-01), Neiger et al.
patent: 6433555 (2002-08-01), Leopold et al.
patent: 6437700 (2002-08-01), Herzfeld et al.
patent: 6437953 (2002-08-01), DiSalvo et al.
patent: 6437955 (2002-08-01), Duffy et al.
patent: 6442007 (2002-08-01), Li
patent: 6465735 (2002-10-01), May
patent: 6515564 (2003-02-01), Leopold et al.
patent: 6532139 (2003-03-01), Kim et al.
patent: 6538862 (2003-03-01), Mason, Jr. et al.
patent: 6540533 (2003-04-01), Schreiber
patent: 6577478 (2003-06-01), Kim et al.
patent: 6611406 (2003-08-01), Neiger et al.
patent: 6643108 (2003-11-01), Cline et al.
patent: 6646838 (2003-11-01), Ziegler et al.
patent: 6657834 (2003-12-01), DiSalvo
patent: 6671145 (2003-12-01), Germain et al.
patent: 6674289 (2004-01-01), Macbeth
patent: 6697238 (2004-02-01), Bonilla et al.
patent: 6724589 (2004-04-01), Funderburk
patent: 6734680 (2004-05-01), Conard
patent: 6734769 (2004-05-01), Germain et al.
patent: 6747367 (2004-06-01), Cline et al.
patent: 6771152 (2004-08-01), Germain et al.
patent: 6788504 (2004-09-01), Vanderkolk
patent: 6813126 (2004-11-01), DiSalvo et al.
patent: 6828886 (2004-12-01), Germain et al.
patent: 6850394 (2005-02-01), Kim
patent: 6859044 (2005-02-01), Hughes
patent: 6864766 (2005-03-01), DiSalvo et al.
patent: 6867954 (2005-03-01), Wu et al.
patent: 6873231 (2005-03-01), Germain et al.
patent: 6897381 (2005-05-01), He et al.
patent: 6915992 (2005-07-01), Gretz
patent: 6944001 (2005-09-01), Ziegler et al.
patent: 6946935 (2005-09-01), Wu et al.
patent: 6949994 (2005-09-01), Germain et al.
patent: 6949995 (2005-09-01), Leopold et al.
patent: 6954125 (2005-10-01), Wu et al.
patent: 6958463 (2005-10-01), Kochman et al.
patent: 6963260 (2005-11-01), Germain et al.
patent: 6972572 (2005-12-01), Mernyk et al.
patent: 6975492 (2005-12-01), DiSalvo
patent: 6982856 (2006-01-01), Bernstein
patent: 6991495 (2006-01-01), Aromin
patent: 2006/0198066 (2006-09-01), Chen et al.
Chen Wusheng
Wang Fu
Wang Lianyun
General Protecht Group Inc.
Morris Manning & Martin LLP
Nguyen Vincent Q.
Tingkang Xia, Esq. Tim
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