Intelligent integrated diagnostics

Details Intelligent integrated diagnostics Intelligent integrated diagnostics

2010-08-06

2011-12-27

Tsai, Carol (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C714S025000, C714S026000, C714SE11029, C716S134000

Reexamination Certificate

active

08086423

ABSTRACT:
A diagnostic tools and methods are disclosed. The diagnostic tool is configured or operable to nominate a commonly connected component in a target system as being faulty if more than a pre-determined number of active components connected to the commonly connected component appear faulty.

REFERENCES:
patent: 4654852 (1987-03-01), Bentley et al.
patent: 4965743 (1990-10-01), Malin et al.
patent: 4985857 (1991-01-01), Bajpai et al.
patent: 5132920 (1992-07-01), Bellows et al.
patent: 5150367 (1992-09-01), Tong et al.
patent: 5412756 (1995-05-01), Bauman et al.
patent: 5528752 (1996-06-01), Kise et al.
patent: 5633800 (1997-05-01), Bankert et al.
patent: 5914875 (1999-06-01), Monta et al.
patent: 6012152 (2000-01-01), Douik et al.
patent: 6249755 (2001-06-01), Yemini et al.
patent: 6560736 (2003-05-01), Ferguson et al.
patent: 7028228 (2006-04-01), Lovy et al.
patent: 7103505 (2006-09-01), Teshima et al.
patent: 7197561 (2007-03-01), Lovy et al.
patent: 7296194 (2007-11-01), Lovy et al.
patent: 7308322 (2007-12-01), Discenzo et al.
patent: 7509540 (2009-03-01), Lovy et al.
patent: 7574644 (2009-08-01), Forlenza et al.
patent: 7600160 (2009-10-01), Lovy et al.
patent: 2001/0003427 (2001-06-01), Ferguson et al.
patent: 2002/0072162 (2002-06-01), Dor et al.
patent: 2003/0167111 (2003-09-01), Kipersztok et al.
patent: 2004/0158409 (2004-08-01), Teshima et al.
patent: 2004/0199573 (2004-10-01), Schwartz et al.
patent: 2005/0015752 (2005-01-01), Alpern et al.
patent: 2006/0112061 (2006-05-01), Masurkar
patent: 2009/0216881 (2009-08-01), Lovy et al.
patent: 0 871 126 (1998-10-01), None
patent: 1 136 912 (2001-09-01), None
patent: WO 2005/045693 (2005-05-01), None
International Search Report for corresponding PCT/GB2004/004585 completed Sep. 13, 2005 by K. Kelperis of the EPO.
Su, et al.: “Prognostics Framework”, The U.S. Army Test, Measurement, and Diagnostic Equipment Activity, The U.S. Arm Aviation and Missile Command, Redstone Arsenal, AL 35898, 1999 IEEE, p. 661-672.
Garbiras, et al.: “Fusing Diagnostic Information Without a Priori Performance Knowledge”; Information Technology Lab, GE Corporate Research & Development, Niskayuna, NY, USA, ISIF 2000, p. TuD5-9-TuD5-16.
Goebel;. et al.; “Diagnostic Information Fusion: Requirements Flowdown and Interface Issues”; GE Corporate Research & Development, Niskayuna, NY, 12309, IEEE 2000, p. 155-162.
Freschi: “Cost and Benefit Considerations for Implementing an Open Systems Approach to Integrated Diagnostics”; 1999, p. 391-404.
Hamilton, et al.: “Fault Diagnosis on Autonomous Robotic Vehicles with Recovery: An Integrated Heterogeneous-Knowledge Approach”; Proceedings of the 2001 IEEE International Conference on Robotics & Automation, Seoul, Korea, May 21-26, 2001, p. 3232-3237.
Hamilton, et al.: “Enhancing AUV Fault-Diagnosis Capabilities with the Recovery System”; IEEE Journal of Oceanic Engineering, vol. XX, No. Y, Month 2001, p. 100-115.
Su, et al.: “Prognostics Framework—Update II”; 2000 IEEE, p. 497-504.
Freschi: “Open Systems Approach Integrated Diagnostics Demonstration(OSAIDD)Study—Final Report”; Jan. 27, 1999, p. 1-68.

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