Intelligent electronic device and method thereof

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C702S066000

Reexamination Certificate

active

08078418

ABSTRACT:
An intelligent electronic device (IED) having a gain control unit adapted to selectively regulate operating ranges of output signals of a sensing circuit of the device is described. In one embodiment, the IED is a digital electric power and energy meter, which operating ranges for supply voltages and supply currents of electrical services may be adjusted to match pre-determined ranges for input signals of a data acquisition system or a data processing module of the meter.

REFERENCES:
patent: 5014229 (1991-05-01), Mofachern
patent: 5212441 (1993-05-01), McEachern et al.
patent: 5224054 (1993-06-01), Wallis
patent: 5233538 (1993-08-01), Wallis
patent: 5298854 (1994-03-01), McEachern et al.
patent: 5298855 (1994-03-01), McEachern et al.
patent: 5298856 (1994-03-01), McEachern et al.
patent: 5298859 (1994-03-01), McEachern et al.
patent: 5298885 (1994-03-01), McEachern et al.
patent: 5298888 (1994-03-01), McEachern et al.
patent: 5300924 (1994-04-01), McEachern et al.
patent: 5302890 (1994-04-01), McEachern et al.
patent: 5307009 (1994-04-01), McEachern et al.
patent: 5347464 (1994-09-01), McEachern et al.
patent: 5574654 (1996-11-01), Bingham et al.
patent: 6185508 (2001-02-01), Van Doorn et al.
patent: 6671635 (2003-12-01), Forth et al.
patent: 7511468 (2009-03-01), McEachern et al.
patent: 2008/0172192 (2008-07-01), Banhegyesi
patent: 2008/0234957 (2008-09-01), Banhegyesi et al.
patent: 2008/0238406 (2008-10-01), Banhegyesi
patent: 2008/0238713 (2008-10-01), Banhegyesi et al.
patent: 2009/0228224 (2009-09-01), Spanier et al.
patent: 2010/0324845 (2010-12-01), Spanier et al.
7700 Ion 3-Phase Power Meter, Analyzer and Controller, pp. 1-8, Nov. 30, 2000.
ION Technology, 7500 ION High Visibility 3-Phase Energy & Power Quality Meter, Power Measurement, specification, pp. 1-8, revision date Mar. 21, 2000.
ION Technology, 7500 ION 7600 ION High Visibility Energy & Power Quality Compliance Meters, Power Measurement, specification, pp. 1-8, revision date Nov. 30, 2000.
User's Installation & Operation and User's Programming Manual. The Futura Series, Electro Industries, pp. 1-64, Copyright 1995.
Nexus 1250 Installation and Operation Manual Revision 1.20, Electro Industries/Gauge Tech, 50 pages, Nov. 8, 2000.
Nexus 1250, Precision Power Meter & Data Acquisition Node, Accumeasure Technology, Electro Industries/Gauge Tech, specification, 16 pages, Nov. 1999.
Performance Power Meter & Data Acquisition Node, Electro Industries/Gauge Tech., Nexus 1250 specification, 8 pages, Dec. 14, 2000.
Futura+Series, “Advanced Power Monitoring and Analysis for the 21st Century”, Electro Industries/Gauge Tech, specification, 8 pages, Apr. 13, 2000.
PowerLogic Series 4000 Circuit Monitors, pp. 1-4; Document #3020HO0601; Jan. 2006.
ION7550/ion7650 PowerLogic power-monitoring units, Technical data sheets, Copyright 2006 Schneider Electric.
European Standard EN-50160; “Voltage characteristics of electricity supplied by public distribution networks”; Copyright 2007 CENELEC; published Oct. 31, 2007; pp. 1-23.
The Dranetz Field Handbook for Power quality Analysis; Dranetz Technologies Incorporated, Edison, NJ; Copyright 1991; pp. 1-271.
International Standard IEC-1180-1; “High-voltage test techniques for low-voltage equipment”; Copyright Commission Electrotechnique Commission 1992; Geneva, Switzerland; pp. 1-62.
International Standard IEC-61000-2-4, Second Edition; “Electromagnetic compatibility (EMC)—Part 2-4:Enviroment-Compatbility levels in industrial plants for low-frequency conducted distribances”; Copyright Commission Electrotechnique Commission 2002; Geneva, Switzerland; pp. 1-84.
International Standard IEC-61000-2-7, Second Edition; “Electromagnetic compatibility (EMC)—Part 4-7:Testing and measurement techniques”; Copyright Commission Electrotechnique Commission 2002; Geneva, Switzerland; pp. 1-80.
International Standard IEC-61000-4-30, Second Edition; “Electromagnetic compatibility (EMC)—Part 4-30:Testing and measurement techniques—Power quality measurement methods”; Copyright Commission Electrotechnique Commission 2003; Geneva, Switzerland; pp. 1-98.
International Standard IEC-687, Second Edition; “Alternating current static watt-hours meters for active energy”; Copyright Commission Electrotechnique Commission 1992; Geneva, Switzerland; pp. 1-36.
IEEE Std 519-1992; IEEE Recommended Practices and Requirements for Harmonic Control in Electrical Power Systems; Copyright The Institute of Electrical and Electronics Engineers, Inc. 1993; New York, NY; pp. 1-101.
IEEE Std 1159-1995; IEEE Recommended Practice for monitoring Electric Power Quality; Copyright The Institute of Electrical and Electronics Engineers, Inc. 1995; New York, NY; pp. 1-76.
“Power Quality—A guide to voltage fluctuation and light flicker”; BChydro Power Smart, Vancouver, B.C., Canada; Dated Mar. 2005; pp. 1-12.
European Standard EN-61000-4-15; “Electromagnetic compatibility (EMC)—Part 4:Testing and measurement techniques, section 15—Flickermeter—Functional and design specifications (IEC 61000-4-15:1997)”; Copyright CENELEC Apr. 1998, Brussels; pp. 1-25

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