Integration of open space/dummy metal at CAD for physical...

Details Integration of open space/dummy metal at CAD for physical... Integration of open space/dummy metal at CAD for physical...

2008-02-21

2011-11-08

Kik, Phallaka (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Design of semiconductor mask or reticle

Manufacturing optimizations

C716S111000, C716S136000, C714S027000, C714S030000, C714S733000, C714S734000, C324S755010, C324S538000

Reexamination Certificate

active

08056025

ABSTRACT:
An access pad is used to provide access to a functional block of an integrated circuit (IC) device. The access pad is formed using dummy metal in an open space in a metallization level that is between a top metallization level and a base level on which the functional block is formed in the IC device. The access pad at the metallization level provides a contact to access an underlying circuit of the functional block so that the functional integrity of the functional block of the IC device can be verified during probing.

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