Integrating time measurement circuit for a channel of a test...

Details Integrating time measurement circuit for a channel of a test... Integrating time measurement circuit for a channel of a test...

2007-11-06

2007-11-06

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S535000, C324S754090, C324S763010, C702S069000

Reexamination Certificate

active

11282297

ABSTRACT:
In a first embodiment of the invention there is provided an electronic chip for use with an automatic testing equipment device testing a device under test. The device under test has a plurality of pins and the electronic chip is placed in a channel of a test card that is associated with one of the pins. An input signal is provided to a pin of the device under test and the resulting output is provided to the pin electronics for the channel of the test card. In most embodiments, the output signal is a voltage signal. One purpose for the electronic chip is to measure jitter based upon timing measurements performed by the electronic chip. Jitter measurements are particularly important for high-speed serial devices. The electronic chip includes an integrating time measurement circuit for receiving the input signal and producing an output signal including a timing measurement of at least a portion of the input signal.

REFERENCES:
patent: 3553582 (1971-01-01), Gouillou
patent: 6721920 (2004-04-01), Rearick et al.
patent: 6795496 (2004-09-01), Soma et al.
patent: 6867613 (2005-03-01), Bienek
patent: 2003/0006750 (2003-01-01), Roberts et al.

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